The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2006

Filed:

Mar. 15, 2005
Applicants:

Takamasa Ando, Gifu, JP;

Yoshiaki Hoashi, Kariya, JP;

Takekazu Terui, Kariya, JP;

Inventors:

Takamasa Ando, Gifu, JP;

Yoshiaki Hoashi, Kariya, JP;

Takekazu Terui, Kariya, JP;

Assignee:

DENSO Corporation, Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G07B 15/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object detecting apparatus for detecting an object or a distance with the object includes at least one light receiving element for detecting a light quantity entering from a sensor window portion for example, a projection window portion and an entrance window portion through which an electromagnetic wave from an electromagnetic wave generation portion toward an object and a reflected electromagnetic wave from the object pass. Furthermore, an irregularity determining portion determines a state of at least one of the projection window portion and the entrance window portion using at least the detected light quantity of the light receiving element. For example, the light receiving element includes a first light receiving portion and a second light receiving portion which receive the light quantities of direct current part of light entering from the first and second light receiving portions.


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