The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2006

Filed:

Mar. 17, 2000
Applicant:

Yonezo Furuya, Hatoyama-machi, JP;

Inventor:

Yonezo Furuya, Hatoyama-machi, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G07D 5/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A coin inspection method and apparatus capable of inspecting coins having different materials and surface patterns with high accuracy by a simple coil arrangement. An exciting coil is arranged in the vicinity of one side of a coin passage inclined at a predetermined angle so that two magnetic poles thereof face the coin passage. Two receiving coils having substantially identical characteristics are arranged in the vicinity of the same side of the coin passage so that the receiving coils are electromagnetically coupled with the exciting coil. The exciting coil is excited at a predetermined frequency and an oscillation voltage of the exciting coil is detected. Also, an influence of a reactive magnetic field produced by eddy current induced on a surface of the coin is detected by the receiving coil. Material of the coin can be determined based on the oscillation voltage level of the exciting coil. The degree of the reactive magnetic field differs depending on a difference in surface irregularity of the coin, so that the coin can be discriminated based on the difference in irregularity. The apparatus is simple in construction and thus manufacturable at low cost.


Find Patent Forward Citations

Furuya, Yonezo. (2006). Coin inspection method and apparatus therefor (U.S. Patent No. 7108120). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7108120

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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