The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2006
Filed:
Jun. 25, 2004
David E. Ferguson, Averill Park, NY (US);
Norman A. Lindeman, Sand Lake, NY (US);
David E. Ferguson, Averill Park, NY (US);
Norman A. Lindeman, Sand Lake, NY (US);
Dynamic Systems Inc., Poestenkill, NY (US);
Abstract
Apparatus for use in a conventional dynamic material testing system to advantageously provide uniform self-resistive specimen heating with enhanced temperature uniformity. Specifically, an anvil stack () in an anvil assembly () has a foil interface () with a composite layer () containing, e.g., a concentrically oriented multi-component arrangement formed of an inner high strength and insulating disk () and an outer ring-shaped resistive region (), situated between an anvil base () and an anvil top (). An insulating member () electrically and thermally insulates all sides of the anvil stack from its supporting structure.