The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
May. 14, 2002
Sasa Tomic, Astoria, NY (US);
Scott P. Devoe, New London, NH (US);
Benjamin D. Wilson, Keene, NH (US);
Jack S. Cook, Jr., Bethlehem, CT (US);
Sasa Tomic, Astoria, NY (US);
Scott P. Devoe, New London, NH (US);
Benjamin D. Wilson, Keene, NH (US);
Jack S. Cook, Jr., Bethlehem, CT (US);
Haestad Methods, Inc., Waterbury, CT (US);
Abstract
A database design modeling system for managing data facets for design scenarios as a collection of hierarchical unitized data alternatives is provided. The database design model allows for easy access to data while providing a single persistant location for any one specific data record, thereby reducing any problems associated with conventional data duplication. Further, all data stored within the database is unitized thus eliminating the need for the user to do the unit mapping. According to one aspect of the present invention, a Relational Database Management System (RDBMS) modeling system can be constructed that allows for exercising multiple 'What if?' scenarios with minimal user intervention and errors by) storing data using a normalized hierarchical storage structure,) providing data address indirection means to access data available from a multitude of data sources,) providing an object model to leverage programmable support to the orthogonal data views, and) providing a GIS client user interface allowing the user to construct a scenario and to view scenario results.