The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Sep. 25, 2003
Ryoko Fujikawa, Kawasaki, JP;
Goro Ito, Kawasaki, JP;
Tetsuya Katayama, Oita, JP;
Yasunobu Tominaga, Shizuoka, JP;
Satoru Kawashima, Shizuoka, JP;
Hitoshi Saito, Shizuoka, JP;
Masanori Hasegawa, Shizuoka, JP;
Ryoko Fujikawa, Kawasaki, JP;
Goro Ito, Kawasaki, JP;
Tetsuya Katayama, Oita, JP;
Yasunobu Tominaga, Shizuoka, JP;
Satoru Kawashima, Shizuoka, JP;
Hitoshi Saito, Shizuoka, JP;
Masanori Hasegawa, Shizuoka, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A test support process and a test support program for producing a post-update test pattern when a program under test is updated. When a program under development is updated, a post-update operation description defining details of an operation of a function included in the program under development after the update is acquired. Next, a pre-update operation description having high commonality with the post-update operation description is selected from among pre-update operation descriptions defining details of operations of functions included in the program under development before the update. A pre-update test pattern for an operational test of the selected pre-update operation description is extracted from among pre-update test patterns prepared for operational tests of the program under development before the update. A post-update test pattern for an operational test of the post-update operation description is generated by inheriting at least a portion of the extracted pre-update test pattern.