The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Nov. 18, 2003
Isaac N. Bankman, Clarksville, MD (US);
Tanya Nizialek, South Riding, VA (US);
Isaac N. Bankman, Clarksville, MD (US);
Tanya Nizialek, South Riding, VA (US);
The Johns Hopkins University, Baltimore, MD (US);
Abstract
A method for segmenting a small feature in a multidimensional digital array of intensity values in a data processor computes an edge metric along each ray of a plurality of multidimensional rays originating at a local intensity extreme (local maximum or minimum). A multidimensional point corresponding to a maximum edge metric on each said ray is identified as a ray edge point. Every point on each ray from the local extreme to the ray edge point is labeled as part of the small object. Further points on the feature are grown by labeling an unlabeled point if the unlabeled point is adjacent to a labeled point, and the unlabeled point has a more extreme intensity than the labeled point, and the unlabeled point is closer than the labeled point to the local extreme. The resulting segmentation is quick, and identifies boundaries of small features analogous to boundaries identified by human analysts, and does not require statistical parameterizations or thresholds manually determined by a user.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile