The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2006

Filed:

Jun. 12, 2002
Applicant:

S. Jeffrey Rosner, Palo Alto, CA (US);

Inventor:

S. Jeffrey Rosner, Palo Alto, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G21K 5/10 (2006.01); G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for forming an image of an object. The system includes a first scanning x-ray source for generating x-rays that diverge from a source point along a first scan path, the point being variable and determined by an input signal provided by a controller. A plurality of x-ray detectors are positioned with respect to the first scan path and are readout by the controller. A conveyor moves the object relative to the first scanning x-ray source and the plurality of x-ray detectors. The object is divided into a plurality of voxels, and the x-ray detectors are positioned such that x-rays pass through each voxel and arrive at one of the detectors when the source point is located at a plurality of points along the first scan path. The controller preferably generates a three-dimensional representation of the object from the x-ray measurements.


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