The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Aug. 24, 2004
Igor Gurevich, Saarbrucken, DE;
Victor Faybishenko, San Carlos, CA (US);
Leonid Velikov, San Carlos, CA (US);
Igor Gurevich, Saarbrucken, DE;
Victor Faybishenko, San Carlos, CA (US);
Leonid Velikov, San Carlos, CA (US);
Microalign Technologies, Inc., San Carlos, CA (US);
Abstract
A flat wide-angle lens system of the invention has a reduced axial length and is intended for creating images with extremely wide angle of observation. The system consists of the first component which is intended for reduction of the field angle of light incidence onto the objective and comprises an assembly of at least two microlens arrays with the same pitch between the adjacent microlenses and arranged with respect to each other so as to provide afocality, and a second component that comprises an assembly of conventional spherical or aspherical microlenses that create an image on an image receiver. Each two coaxial microlenses of the microlens arrays of the first component form an inverted microtelescope of Galileo. The outlet aperture of a single microtelescope is made so that spherical aberration can be minimized almost to 0, while field aberrations can be corrected by design parameters of the microlenses.