The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Sep. 26, 2003
Applicants:
Decai Sun, Los Altos, CA (US);
Joel A. Kubby, Rochester, NY (US);
Jingkuang Chen, Rochester, NY (US);
Alex T. Tran, Madison, NJ (US);
Patrick Y. Maeda, Mountain View, CA (US);
Inventors:
Decai Sun, Los Altos, CA (US);
Joel A. Kubby, Rochester, NY (US);
Jingkuang Chen, Rochester, NY (US);
Alex T. Tran, Madison, NJ (US);
Patrick Y. Maeda, Mountain View, CA (US);
Assignee:
Xerox Corporation, Stamford, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
A tunable microelectromechanical (MEMS) spectrophotometer with a rotating cylindrical reflective diffraction grating is integrated with a photodetector and an optical fiber light source on a Rowland circle on a monolithic silicon substrate.