The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2006

Filed:

Dec. 09, 2003
Applicants:

David Geoffrey Marrow, Taylor Lake Village, TX (US);

Andrew M. Cochran, Farmersville, LA (US);

Scott Thomas Roger, Baton Rouge, LA (US);

Inventors:

David Geoffrey Marrow, Taylor Lake Village, TX (US);

Andrew M. Cochran, Farmersville, LA (US);

Scott Thomas Roger, Baton Rouge, LA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods are provided for determining and controlling polymer product properties on-line in a slurry reactor system, such as a stirred slurry or slurry loop reactor. The methods include obtaining a regression model for determining a polymer product property, the regression model including principal component loadings and principal component scores, acquiring a Raman spectrum of polymer product in the slurry reactor system, calculating a new principal component score from at least a portion of the Raman spectrum and the principal component loadings, and calculating the polymer product property by applying the new principal component score to the regression model. The property can be controlled by adjusting at least one polymerization parameter based on the calculated polymer product property.


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