The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2006

Filed:

Jun. 18, 2004
Applicants:

Mitsuaki Igeta, Kawasaki, JP;

Shigetoshi Wakayama, Kawasaki, JP;

Seiji Endou, Kawasaki, JP;

Inventors:

Mitsuaki Igeta, Kawasaki, JP;

Shigetoshi Wakayama, Kawasaki, JP;

Seiji Endou, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An input circuit writes an expected value to one end of an evaluation wiring. A latch circuit latches a logic level of the other end of the evaluation wiring. A first switch circuit connects an output of the input circuit to the input of the latch circuit. A second switch circuit connects the output of the input circuit to the one end of the evaluation wiring. A third switch circuit connects the other end of the evaluation wiring to the input of the latch circuit. By turning on, off, and off the first to third switch circuits, respectively, the output of the input circuit is directly connected to only the input of the latch circuit. In this state, the input circuit writes an expected value, and a logic level is read from the latch circuit. Accordingly, failure of the evaluation wiring can be easily discriminated from other failure.


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