The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Sep. 17, 2003
Luiz B. Da Silva, Danville, CA (US);
Charles L. Chase, Dublin, CA (US);
Bruce W. Haughey, Redwood City, CA (US);
Luiz B. Da Silva, Danville, CA (US);
Charles L. Chase, Dublin, CA (US);
Bruce W. Haughey, Redwood City, CA (US);
BioLuminate, Inc., San Carlos, CA (US);
Abstract
A low capacitance measurement probe is disclosed. The low capacitance measurement probe comprises an outer conductor forming an outer wall having an exterior and an interior; a non-conductive spacer forming a first wall having an exterior and an interior with the non-conductive spacer being coupled to the interior of the outer conductor; a conductive layer forming a second wall having an exterior and an interior, the conductive layer coupled to the interior of the first wall; an insulating layer forming a third wall having an exterior and an interior, the insulating layer coupled to the interior of the second wall; and an inner conductor forming an inner wall having an exterior and an interior, the inner conductor coupled to the interior of the third wall. A low capacitance measurement probe system and a method of using a low capacitance measurement probe are also disclosed.