The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Jan. 25, 2005
Applicants:
Ian Radley, Glenmont, NY (US);
Michael D. Moore, Alplaus, NY (US);
Inventors:
Ian Radley, Glenmont, NY (US);
Michael D. Moore, Alplaus, NY (US);
Assignee:
X-Ray Optical Systems, Inc., East Greenbush, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A diagnostic technique for an x-ray source. A system monitors existing conditions (e.g., tube current Y) in the source to track degradation of certain components to anticipate failure. Storage of past characteristics and reference characteristics is also provided for predicting failure and other operating conditions of the source. Communication techniques are provided for the monitoring and warning functions.