The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2006

Filed:

Nov. 10, 2004
Applicants:

Jérôme Inglese, Guilherand, FR;

Bertrand Leverrier, Montelier, FR;

Claude Rougeot, Lyons, FR;

Inventors:

Jérôme Inglese, Guilherand, FR;

Bertrand Leverrier, Montelier, FR;

Claude Rougeot, Lyons, FR;

Assignee:

Thales, Neuilly sur Seine, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 15/00 (2006.01); G01P 15/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a differential accelerometer micromachined in a plane plate, comprising a base and a differential measurement cell which includes a moveable seismic mass and two force sensors that are connected to the mass and to the base. Under the effect of an acceleration along Ox and/or Oy, Ox and Oy being directions orthogonal to the plane of the plate, the seismic mass is capable of undergoing linear displacement along a direction parallel to the acceleration, and has a center of gravity located at the intersection of a plane Aperpendicular to the plane of the plate and passing through Ox and of a plane Aperpendicular to the plane of the plate and passing through Oy; a first force sensor comprises, along Ox, two identical detection systems for a differential measurement of the linear displacement along Ox, and associated with each detection system a filtering system connected to the base, and a second force sensor comprises, along Oy, two other identical detection systems for the differential measurement of the linear displacement along Oy, and associated with each detection system a filtering system connected to the base, each filtering system allowing the associated detection system to move along a direction perpendicular to that of its detection without permitting it to move along its detection direction.


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