The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Apr. 22, 2003
Martin Wisecarver, Fremont, CA (US);
Charles HU, Sunnyvale, CA (US);
Martin Wisecarver, Fremont, CA (US);
Charles Hu, Sunnyvale, CA (US);
Finisar Corporation, Sunnyvale, CA (US);
Abstract
Embodiments of the invention generally provide an in situ method for assembling and measuring optical characteristics of an optical component. The method generally includes pressing an optical source or lens into an optical housing while simultaneously measuring the optical output of the device. The measured optical output is used to determine and control when the optical source or lens is pressed to an optical position within optical housing. Once the source or lens is pressed into the optical housing, the method includes measuring the optical offset and/or pointing angle of the assembled component in the same apparatus that assembled the component. The measured optical offset and/or pointing angle information is used to determine how to mechanically alter the optical housing to correct or compensate for the optical offset and pointing angle.