The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2006

Filed:

Apr. 04, 2002
Applicants:

Arvind Krishnamurthy, Hamden, CT (US);

Jaswinder Pal Singh, New York, NY (US);

Randolph Wang, Princeton, NJ (US);

Xiang Yu, College Park, MD (US);

Inventors:

Arvind Krishnamurthy, Hamden, CT (US);

Jaswinder Pal Singh, New York, NY (US);

Randolph Wang, Princeton, NJ (US);

Xiang Yu, College Park, MD (US);

Assignee:

firstRain, Inc., Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to a method and apparatus for extracting relevant data. A first and a second set of data are accessed. The first set includes selected data. An edit sequence is determined between the first and the second sets, including considering at least repetitions for inclusion in the edit sequence. Corresponding data of the second set have a correspondence to the selected data are found at least partly by determining the edit sequence. A first and a second tree of data are accessed. The first tree includes selected data. An edit sequence is determined between the first and the second trees, including considering at least repetitions for inclusion in the edit sequence. Corresponding data of the second tree have a correspondence to the selected data are found at least partly by determining the edit sequence.


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