The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Jan. 22, 2003
Abraham Krieger, San Diego, CA (US);
Donald Brian Eidson, San Diego, CA (US);
Abraham Krieger, San Diego, CA (US);
Donald Brian Eidson, San Diego, CA (US);
Conexant Systems, Inc., Newport Beach, CA (US);
Abstract
A method and system are described for assigning reliability metrics to error correction coded bits or symbols that are decoded. Survivor and non-survivor paths through a portion of a trellis representation within a sliding window are determined and recorded. Primary and non-primary traceback paths through a portion of the trellis representation are determined from the recorded data. If the primary and non-primary traceback paths diverge at a release point, a reliability metric is assigned to the bit or symbol estimate corresponding to the release point. This metric is derived from the difference between the path metrics of the primary and non-primary traceback paths. Alternately, if the two paths diverge through all or a portion of a release zone, a reliability metric is assigned to the block of bit or symbol estimates corresponding to the portion or more of the release zone where the two paths diverge from one another. Again, this metric is derived from the difference between the path metrics of the primary and non-primary traceback paths.