The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2006

Filed:

Mar. 29, 2002
Applicants:

Manfred Bartz, Snohomish, WA (US);

Craig Nemecek, Seattle, WA (US);

Matt Pleis, Carnation, WA (US);

Inventors:

Manfred Bartz, Snohomish, WA (US);

Craig Nemecek, Seattle, WA (US);

Matt Pleis, Carnation, WA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An emulation and debugging system that includes an in-circuit emulator couplable to a microcontroller. The in-circuit emulator is adapted to execute an event thread in lock-step with the microcontroller. Event information generated as a result of executing the event thread is sampled at selected points and the sampled event information is stored in memory. Trace information is also recorded at the selected points. The sampled event information and the recorded trace information are time-stamped. In one embodiment, a display device is coupled to the in-circuit emulator. The display device is used for displaying analog and/or digital waveforms representing the sampled event information and the recorded trace information. Accordingly, an in-circuit emulator system can also function as an oscilloscope and/or as a logic analyzer, allowing a user to view event and trace information, along with other information, that are generated as part of the debugging process.


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