The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Jan. 14, 2003
Rupert Maier, Eggolsheim, DE;
Ralf Sykosch, Weilersbach, DE;
Rupert Maier, Eggolsheim, DE;
Ralf Sykosch, Weilersbach, DE;
Siemens Aktiegesellschaft, Munich, DE;
Abstract
A standard, modularly expandable system is for measuring and analyzing far spread signals from industrial processes consisting of several partial processes in an essentially feedback-free and synchronous manner. Random signals occurring in the partial processes are detected by way of measuring heads, optionally provided with a time stamp, and transferred to a measuring bus system in a predefined form as measuring signals or time signals. The measuring bus system is not identical with existing automation-related bus systems. The measuring signals and/or time signals are further processed by data concentrators. Evaluation units and/or display units that are local or indefinitely removed from the industrial process make it possible to further process or visualize measuring signals and/or time signals. The measuring heads detect a standard time signal such as the one of the global positioning system.