The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2006

Filed:

Nov. 23, 2004
Applicants:

Rasiklal Punjalal Shah, Latham, NY (US);

Vrinda Rajiv, Schenectady, NY (US);

Mark David Osborn, Schenectady, NY (US);

Mahesh Kumar Asati, Bangalore, IN;

Piero Patrone Bonissone, Schenectady, NY (US);

Inventors:

Rasiklal Punjalal Shah, Latham, NY (US);

Vrinda Rajiv, Schenectady, NY (US);

Mark David Osborn, Schenectady, NY (US);

Mahesh Kumar Asati, Bangalore, IN;

Piero Patrone Bonissone, Schenectady, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for predicting a time to failure of a component in a system is presented. The method comprises obtaining a set of data measurements related to the component. The set of data measurements are representative of a plurality of parameters including a plurality of leading parameters. The method comprises generating a prediction model based upon the leading parameters considered in combination. The prediction model is then used to predict the time to failure of the component based on a set of real-time measurements, wherein the plurality of parameters are processed to predict the time to failure for the component. Finally, a confidence level for the predicted time to failure is determined based upon the plurality of parameters.


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