The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Feb. 28, 2006
Charles A. Lee, Camarillo, CA (US);
Charles A. Lee, Camarillo, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
An exemplary inertial measurement apparatus incorporates self-calibrating bias correction signals. First and second inertial instruments generate respective input signals representative of an inertial attribute to be measured. A bias estimator generates first and second bias correction signals. First and second summation nodes receive the respective input signals and the respective first and second bias correction signals. The first and second summation nodes provide respective summed signals to the first and second inertial instruments. The first and second inertial instruments generate respective output signals representative of a value of the inertial attribute based on the respective summed signals. The bias estimator calculates the first and second bias correction signals based on first and second measurements made during respective first and second time intervals where a sign of one of the first and second bias error signals changes from one state during the first time interval to the other state during the second time interval.