The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Jan. 28, 2003
Marion A. Keyes, St. Louis, MO (US);
Marion A. Keyes, St. Louis, MO (US);
Rosemount Analytical Inc., Anaheim, CA (US);
Abstract
A control system includes a measurement device capable of gathering high frequency process parameter data, a modeling routine which uses the high frequency parameter data to develop a model of the high frequency noise and a compensation routine that employs the developed model to adjust a control signal to thereby compensate for the high frequency noise present within the process parameter. The measurement device may measure a process variable at a relatively high frequency and send a subset of the measured data (e.g., the low frequency data) to a standard controller that generates a control signal to control the measured process parameter in any known manner. The modeling routine analyzes the high frequency data and develops a mathematical model of the high frequency noise within the process variable. The resulting mathematical model may then be used by the compensation routine to alter the standard control signal produced by the controller before that control signal is delivered to or used by the device being controlled.