The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2006

Filed:

Dec. 20, 2000
Applicants:

Jeffrey A. Korn, Lexington, MA (US);

Walid A. Atia, Lexington, MA (US);

Inventors:

Jeffrey A. Korn, Lexington, MA (US);

Walid A. Atia, Lexington, MA (US);

Assignee:

Axsun Technologies, Inc., Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A scanning optical monitoring system and method are appropriate for high speed scanning of a WDM signal band. The system and method are able to identify dropped channels or, more generally, discrepancies between the determined or detected channel inventory and a perpetual inventory for the WDM signal, which perpetual inventory specifies the channels that should be present in the WDM signal assuming proper operation of the network. The system includes a tunable optical filter that scans a pass band across a signal band of a WDM signal to generate a filtered signal. A photodetector then generates an electrical signal in response to this filtered signal. A decision circuit compares the electrical signal to a threshold and a controller, which is responsive to the decision circuit, inventories the channels in the WDM signal.


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