The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2006

Filed:

Mar. 22, 2004
Applicants:

Paul J. Moller, Lake Zurich, IL (US);

Eric L. Krenz, Crystal Lake, IL (US);

James P. Phillips, Lake In The Hills, IL (US);

Hugh K. Smith, Palatine, IL (US);

Inventors:

Paul J. Moller, Lake Zurich, IL (US);

Eric L. Krenz, Crystal Lake, IL (US);

James P. Phillips, Lake In The Hills, IL (US);

Hugh K. Smith, Palatine, IL (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01S 7/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A radio frequency anechoic test chamber () includes a test stand () that includes a relatively small diameter, mechanically robust, telescoping lower vertical support column (), a large diameter thin walled middle vertical support column () that includes a sheet or coating of absorbing material () disposed proximate the circumference of the thin walled middle support column, () and an upper support member (). The radio frequency anechoic test chamber provides improved ripple performance that allows more accurate measurements of the gain pattern of radio frequency equipment.


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