The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2006

Filed:

Aug. 20, 2004
Applicants:

Ray A. Reyes, New Windsor, NY (US);

David L. Schmoke, Verbank, NY (US);

Edward Sherwood, Wingdale, NY (US);

Inventors:

Ray A. Reyes, New Windsor, NY (US);

David L. Schmoke, Verbank, NY (US);

Edward Sherwood, Wingdale, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G08B 13/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test fixture for evaluating an RF identification system and related methods for evaluating an RF tag and/or an RF antenna, are disclosed. The test fixture provides predefined RF tag positions that can be used to test: read position, distance and antenna capability and adjustments. By placing an actual RF tag in each of the predefined positions, a read of the tag information can be performed. A three dimensional plot can then be established for the sensitivity field of the antenna. By placing the RF tag in various positions and orientations, the antenna can be adjusted until an optimum field is produced. The invention can also be used to determine RF tag performance within the optimized field.


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