The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Nov. 05, 2004
Melia F. Gordon, Nagasaki, JP;
Charles Ray Johns, Austin, TX (US);
Hiroki Kihara, Austin, TX (US);
Iwao Takiguchi, Kanagawa, JP;
Tetsuji Tamura, Tokyo, JP;
Michael Fan Wang, Austin, TX (US);
Kazuaki Yazawa, Chiba, JP;
Munehiro Yoshida, Austin, TX (US);
Melia F. Gordon, Nagasaki, JP;
Charles Ray Johns, Austin, TX (US);
Hiroki Kihara, Austin, TX (US);
Iwao Takiguchi, Kanagawa, JP;
Tetsuji Tamura, Tokyo, JP;
Michael Fan Wang, Austin, TX (US);
Kazuaki Yazawa, Chiba, JP;
Munehiro Yoshida, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
An integrated circuit die is disclosed including a temperature detection circuit and a memory configured to store calibration data. The temperature detection circuit is operatively coupled to the memory, and receives an input signal. The temperature detection circuit is configured to produce an output signal dependent upon the input signal and indicative of whether a temperature of the integrated circuit die is greater than a selected temperature. During a normal operating mode of the integrated circuit die the input signal comprises the calibration data. A system and methods for calibrating the temperature detection circuit are also described.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile