The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2006

Filed:

Jul. 18, 2003
Applicants:

Yasuo Yamagishi, Kawasaki, JP;

Takeshi Shioga, Kawasaki, JP;

John David Baniecki, Kawasaki, JP;

Kazuaki Kurihara, Kawasaki, JP;

Inventors:

Yasuo Yamagishi, Kawasaki, JP;

Takeshi Shioga, Kawasaki, JP;

John David Baniecki, Kawasaki, JP;

Kazuaki Kurihara, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); H01R 13/00 (2006.01); G01R 31/26 (2006.01); H01L 29/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe card includes probes, a build-up interconnection layer having a multilayer interconnection structure therein and carrying the probes on a top surface in electrical connection with the multilayer interconnection structure, and a capacitor provided on the build-up interconnection layer in electrical connection with one of the probes via the multilayer interconnection structure, wherein the multilayer interconnection structure includes an inner via-contact in the vicinity of the probe and the capacitor is embedded in a resin insulation layer constituting the build-up layer.


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