The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Mar. 17, 2005
Applicants:
Richard Scott Hinks, Waukesha, WI (US);
Bryan James Mock, Lake Mills, WI (US);
Bruce David Collick, Madison, WI (US);
Frederick Joseph Frigo, Waukesha, WI (US);
Tejaswini Shubhachint, Waukesha, WI (US);
Inventors:
Richard Scott Hinks, Waukesha, WI (US);
Bryan James Mock, Lake Mills, WI (US);
Bruce David Collick, Madison, WI (US);
Frederick Joseph Frigo, Waukesha, WI (US);
Tejaswini Shubhachint, Waukesha, WI (US);
Assignee:
General Electric Company, Schenectady, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A nearest neighbor phase correction technique is implemented to reduce image artifacts due to phase errors in data acquired in an EPI scan. Image quality for EPI applications, such as DWI, DTI, and fMRI, is improved.