The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Mar. 09, 2001
Osamu Kuroda, Kaisei-machi, JP;
Hiroyuki Karasawa, Kaisei-machi, JP;
Osamu Kuroda, Kaisei-machi, JP;
Hiroyuki Karasawa, Kaisei-machi, JP;
Fuji Photo Film Co., Ltd., Kanagawa-ken, JP;
Abstract
The inspection method comprises: preparing a storage fluorescent inspection sheet that has stored and recorded a radiation inspection image which has a density pattern in which one or more low-density and high-density regions having a contrast difference of at least 1:20 are arrayed in a horizontal scanning direction; obtaining an image inspection signal representing the radiation inspection image, by photoelectrically reading the radiation inspection image from the storable fluorescent inspection sheet; and inspecting the influence of stray light, based on an image reproduced from the image inspection signal. An inspection image plate has contrast differences of high-density and low-density regions of at least 1:20.