The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Jun. 27, 2002
Reiner Spolaczyk, Hamburg, DE;
Andreas Maass, Hamburg, DE;
Rainer Treptow, Norderstedt, DE;
Eppendorf AG, Hamburg, DE;
Abstract
A device for photometric measurement of several samples () that are exposed to radiation from a light source () associated therewith. The light modified by the samples () is intercepted by an optical device () and is guided as a sum of all the light radiated from all samples () to at least one sensor () for measuring the intensity and evaluation thereof in an evaluation device () arranged downstream. The light sources () are controlled individually by a control device () and the evaluation device () and the control device () are controlled such that the evaluation device () separates the light from each sample () from the light of the other samples. The control device () modulates the light source () with various signals, which are pre-assigned to the evaluation device () and used to determine the light signals of the individual samples () from the sum signal received by the sensor ().