The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2006
Filed:
Sep. 17, 2002
William Jackson Devlin, Sr., Lincoln University, PA (US);
David R. Thompson, Kennett Square, PA (US);
William Jackson Devlin, Sr., Lincoln University, PA (US);
David R. Thompson, Kennett Square, PA (US);
Dade Behring Inc., Deerfield, IL (US);
Abstract
A dual analyzer system comprising at least two analyzers where samples to be tested are partitioned into three groups in accord with the frequency the test assays are requested. One analyzer performs a portion of the most frequently menu assays and all of a first subgroup of less frequently requested assays. The second analyzer performs a similar portion of the most frequently menu assays and all of a second subgroup of less frequently requested assays. The first of the analyzers is not equipped to perform any of the second subgroup of assays and the second analyzer is not be equipped to perform any of the second subgroup of assays.