The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2006

Filed:

Mar. 26, 2001
Applicants:

Khoi A. Phan, San Jose, CA (US);

Michael K. Templeton, Atherton, CA (US);

Bhanwar Singh, Morgan Hill, CA (US);

Inventors:

Khoi A. Phan, San Jose, CA (US);

Michael K. Templeton, Atherton, CA (US);

Bhanwar Singh, Morgan Hill, CA (US);

Assignee:

Advanced Micro Devices, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01); G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system for performing inventory control for wafers, unpackaged integrated circuits and packaged integrated circuits is provided. The system includes barcode readers, sorters and transporters operable to locate and relocate wafers, unpackaged circuits and packaged circuits. The system further includes a feedback system for feeding back information generated by the barcode readers, sorters, transporters and/or manufacturing devices associated with the wafers, unpackaged circuits and packaged circuits. The system further provides for generating Electronic Data Interchange (EDI) data that can be transmitted to wafer suppliers and employed in controlling wafer ordering, purchasing, processing and returning.


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