The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Jul. 29, 2002
Jari Kallela, Espoo, FI;
Gerhard Vollmar, Meckenheim, DE;
Szanislo Szöke, Gesues, BE;
ABB Research LTD, Zurich, CH;
Abstract
A method is described for the automated determination of fault events by evaluation of field data of a production installation within a system for determining the effectiveness (overall equipment effectiveness (OEE)) of the production installation and for the analysis of causes of faults. The determination of the fault events takes place using a data processing device and programs stored in it for carrying out the functions of a fault event detector and an OEE script configurer. The OEE script configurer accesses a prescribed productivity model specific to a production installation type, generates an OEE script with likewise prescribed configuration data taken into account and stores it in an OEE script memory. The fault event detector accesses the OEE script, calls up field data from a data server, derives fault events from the field data according to processing instructions of the OEE script, and stores them in a fault database.