The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Sep. 02, 2004
Franklyn Shihyu Wu, Berkeley, CA (US);
Jeffrey P. Erhardt, San Jose, CA (US);
Paul J. Steffan, Elk Grove, CA (US);
Jerry H. G. Tsiang, Cupertino, CA (US);
Shivananda S. Shetty, Sunnyvale, CA (US);
John J. Wang, San Jose, CA (US);
Franklyn Shihyu Wu, Berkeley, CA (US);
Jeffrey P. Erhardt, San Jose, CA (US);
Paul J. Steffan, Elk Grove, CA (US);
Jerry H. G. Tsiang, Cupertino, CA (US);
Shivananda S. Shetty, Sunnyvale, CA (US);
John J. Wang, San Jose, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method and system of processing tester information of a system under test is provided. Data of a tested characteristic of the system under test is generated. A distribution curve is extracted from the data. A signature of the distribution curve is determined, and a map of the signature on a depiction of the system under test is presented. The distribution curve also can be categorized in a plurality of bins, and bitmaps are generated for the sections in each of the plurality of bins. Systematic signatures are determined from the bitmaps in the block, and the signatures are correlated with the locations on the system under test.