The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2006

Filed:

Apr. 28, 2005
Applicants:

Tse-hsiang Hsu, Hsin-Chu, TW;

Wei-hsuan Tu, Taipei, TW;

Inventors:

Tse-Hsiang Hsu, Hsin-Chu, TW;

Wei-Hsuan Tu, Taipei, TW;

Assignee:

Mediatek Incorporation, Hsin-Chu Hsien, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses a multiphase waveform generator capable of performing phase calibration, and a related phase calibration method. The disclosed multiphase waveform generator includes a multiphase waveform generating module and a calibrating module. The multiphase waveform generating module receives an input signal and shifts edges of the input signal by a delay time according to a delay parameter to generate a phase-modified signal. The calibrating module is coupled to the multiphase waveform generating module for calibrating the delay time to reduce a difference between a characteristic value of the phase-modified signal and an expected value, which is calculated according to the delay parameter and characteristic values of a first and a second predetermined periodic signal.


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