The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Nov. 15, 2003
John M. Heumann, Loveland, CO (US);
Colin Fox, Auckland, NZ;
David Gines, Ft. Collins, CO (US);
Nicholas Tufillaro, San Francisco, CA (US);
John M. Heumann, Loveland, CO (US);
Colin Fox, Auckland, NZ;
David Gines, Ft. Collins, CO (US);
Nicholas Tufillaro, San Francisco, CA (US);
Agilent Technologies, Inc, Palo Alto, CA (US);
Abstract
A tomographic reconstruction method and system incorporating Bayesian estimation techniques to inspect and classify regions of imaged objects, especially objects of the type typically found in linear, areal, or 3-dimensional arrays. The method and system requires a highly constrained model M that incorporates prior information about the object or objects to be imaged, a set of prior probabilities P(M) of possible instances of the object; a forward map that calculates the probability density P(D|M), and a set of projections D of the object. Using Bayesian estimation, the posterior probability p(M|D) is calculated and an estimated model Mof the imaged object is generated. Classification of the imaged object into one of a plurality of classifications may be performed based on the estimated model M, the posterior probability p(M|D) or MAP function, or calculated expectation values of features of interest of the object.