The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Mar. 12, 2003
Han-wen Hsu, Hsin-Chu, TW;
Ming-hsien Tsai, Kao-Hsiung, TW;
Han-Wen Hsu, Hsin-Chu, TW;
Ming-Hsien Tsai, Kao-Hsiung, TW;
MediaTek Inc., Hsin-Chu, TW;
Abstract
A method in which, during an optimal power calibration (OPC) process, an optical disk drive performs a plurality of write tests to an optical disk at a plurality of test powers and measures a corresponding plurality of modulation signal strength values of the optical disk for the plurality of write tests to generate a modulation signal strength versus power curve. The method then determines possible gamma lines corresponding to considered powers, and selects a considered power as a target power of the optical disk drive when a possible gamma line is substantially tangential to the modulation signal strength versus power curve at the considered power. According to the method, powers within a domain of the plurality of test powers are considered until a considered power is selected as the target power for the optical disk.