The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2006

Filed:

May. 06, 2004
Applicants:

Vidi A. Saptari, Chelsea, MA (US);

Kamal Youcef-toumi, Cambridge, MA (US);

Inventors:

Vidi A. Saptari, Chelsea, MA (US);

Kamal Youcef-Toumi, Cambridge, MA (US);

Assignee:

Delta Search Labs, Inc., Cambridge, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to spectroscopic methods and systems for collecting electromagnetic radiation from an object using a continuously-spinning wavelength-selecting (CSWS) device, e.g., an interference filter(s) or grating. One embodiment of the invention provides a spectroscopic system for collecting electromagnetic radiation from a target. The spectroscopic system has at least one beam of electromagnetic radiation that interacts with the target. The system includes a continuously spinning wavelength-selecting (CSWS) device, e.g., a continuously spinning interference filter/grating driven by a DC motor, in the path of the at least one beam. The device filters the radiation with regard to wavelength to produce filtered radiation. The system further includes at least one detector in the path of the at least one beam for detecting the filtered radiation.


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