The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Aug. 24, 2005
Chien-chih Jen, Taipei, TW;
Chun-hung Tung, Pingtung, TW;
Fu-yuan Shiau, Chiayi, TW;
Yuan-hao Chang, Taipei, TW;
Chien-Chih Jen, Taipei, TW;
Chun-Hung Tung, Pingtung, TW;
Fu-Yuan Shiau, Chiayi, TW;
Yuan-Hao Chang, Taipei, TW;
Chunghwa Picture Tubes, Ltd., Taipei, TW;
Abstract
An array of active devices and a method for testing an array of active devices are provided. The array comprises a substrate, a plurality of scan lines, a plurality of data lines, a plurality of pixel units and a plurality of test pads. The substrate comprises a display area and a peripheral area. The scan lines and the data lines are positioned on the substrate, and enclose a plurality of pixel areas and dummy pixel areas in the display area and the peripheral area, respectively. The pixel units are positioned in the pixel areas and are connected to the scan lines and the data lines, respectively. Finally, The test pads are positioned close to the scan lines and/or the data lines, and positioned on the substrate and in the peripheral area. Each of the test pads is connected to the corresponding data line or the corresponding scan line.