The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Mar. 11, 2005
Nozomu Inoue, Nagano, JP;
Takeshi Sowa, Nagano, JP;
Yoichi Mitsui, Nagano, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
In order to measure a characteristics of a light beam which is repetitively deflected by a light scanning device within a first range in a first direction at a first velocity, there is provided a plate formed with at least one slit extending in a direction angled from the first direction and having a constant width. The plate is moved within the first range in the first direction at a second velocity which is sufficiently lower than the first velocity. A peak value of an optical power of light passing through the slit every time is detected when the deflected light beam crosses the slit being moved, thereby obtaining peak values at plural positions in the first direction. The peak values are displayed on a screen collectively in such a manner that positions on the screen correspond to the positions in the first direction.