The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2006

Filed:

Dec. 11, 2001
Applicants:

Rosann Marie Kaylor, Cumming, GA (US);

Difei Yang, Alpharetta, GA (US);

Zdravko Savov Atanassov, Alpharetta, GA (US);

Michael Eugene Knotts, Roswell, GA (US);

Inventors:

Rosann Marie Kaylor, Cumming, GA (US);

Difei Yang, Alpharetta, GA (US);

Zdravko Savov Atanassov, Alpharetta, GA (US);

Michael Eugene Knotts, Roswell, GA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
Abstract

An analyzer useful in determining the presence of an analyte using a diffraction based sensing device and methods and systems using this device. The present invention may be used with a variety of different diffraction-based diagnostic methods and systems. The analyzer enhances the accuracy and/or usefulness of these devices in detecting analytes, while providing more ease-of-use and convenience to the user. The analyzer may include a light source, a photodiode, a microprocessor and a display system for informing the user of the result. Other features include mirrors, lenses, a sample holder, and a mask for blocking out some light. The analyzer and related method and system may be used in a large number of environments, including commercial, professional, and individual.


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