The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
May. 03, 2000
Applicant:
Takehiko Onuma, Shioya-gun, JP;
Inventor:
Takehiko Onuma, Shioya-gun, JP;
Assignee:
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/02 (2006.01); G01N 35/02 (2006.01); G01N 15/06 (2006.01); G02N 21/00 (2006.01); G05B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An automatic analyzer analyzes a measurement item by making a sample and reagent react with each other and measuring the reaction result. This apparatus allows parameters associated with reagent dispensing executed by a reagent dispensing mechanism to be set as a dispensing condition for each measurement item or each type of reagent, and controls the reagent dispensing mechanism on the basis of the dispensing condition.
Quick Actions:
Onuma, Takehiko. (2006). Automatic analyzer (U.S. Patent No. 7097808). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7097808
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