The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2006

Filed:

Sep. 10, 2002
Applicants:

Alex Leyfer, Palo Alto, CA (US);

Alexander Balva, San Bruno, CA (US);

Andrew Leman, San Rafael, CA (US);

Sergey Finkelsteyn, Sunnyvale, CA (US);

Elena Dolgopiatova, San Rafael, CA (US);

Inventors:

Alex Leyfer, Palo Alto, CA (US);

Alexander Balva, San Bruno, CA (US);

Andrew Leman, San Rafael, CA (US);

Sergey Finkelsteyn, Sunnyvale, CA (US);

Elena Dolgopiatova, San Rafael, CA (US);

Assignee:

Exigen Group, San Francisco, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

An execution unit comprising a runlet and execution environments and methods for using runlets. According to one aspect, abstract parameters comprising function arguments defined for child runlet functions may be bound to corresponding real variables in a parent runlet. As a result, when a function corresponding to a child runlet gets invoked, it uses the current values of the parent runlet variables as the function arguments. According to another aspect, each runlet execute in an execution context comprising an instance of variables and parameters declared by that runlet. A context manager, typically implemented by an application server, may be used to manage execution of the runlets so as to prevent anomalies, such as race conditions. According to another aspect, abstract parameters for a runlet may be bound to corresponding application parameters for an application.


Find Patent Forward Citations

Loading…