The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Feb. 19, 2003
Kouji Uesaka, Kawasaki, JP;
Shuichi Kameyama, Kawasaki, JP;
Takeshi Yanase, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A test system for circuits which is capable of selecting any one of a plurality of circuits to be tested and testing a selected circuit to be tested, includes a tested circuit data producing unit which produces tested circuit data concerning any one of several circuits to be tested; and a control unit which controls a plurality of programmable gate arrays (PGAs) on the basis of an output of the tested circuit data producing unit. Furthermore, the test system for circuits includes a plurality of PGAs each of which is connected to the control unit and generates a test pattern in response to control data sent from the control unit according to a program; and interface units which are associated with the plurality of PGAS, respectively, and are connected to the circuits to be tested.