The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Sep. 16, 2002
Applicants:
Richard G. Fant, Austin, TX (US);
Kevin E. Ayers, Leander, TX (US);
Paul B. Hokanson, Bastrop, TX (US);
Inventors:
Richard G. Fant, Austin, TX (US);
Kevin E. Ayers, Leander, TX (US);
Paul B. Hokanson, Bastrop, TX (US);
Assignee:
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system for testing a microprocessor. The method includes executing debug application software on an external device, downloading diagnostic program instructions from the external device to a cache memory within the microprocessor via a serial test interface. Once the diagnostic program instructions are loaded into the cache memory, the method includes executing the diagnostic program instructions from within the cache memory.