The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2006

Filed:

Mar. 22, 2002
Applicants:

Donglok Kim, Issaquah, WA (US);

Shih-jong J. Lee, Bellevue, WA (US);

Seho OH, Mukilteo, WA (US);

Inventors:

Donglok Kim, Issaquah, WA (US);

Shih-Jong J. Lee, Bellevue, WA (US);

Seho Oh, Mukilteo, WA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A learning acceleration method is disclosed that can be applied to multiple types and stages of learning to enhance the learning efficiency and outcome. Artificially created training samples can improve representation of all classes in the training set, decrease the difficulty of obtaining sufficient training samples, and decrease the difficulty of unequal sample prevalence. Two specific embodiments of learning acceleration are disclosed: learning accelerated algorithm training and learning accelerated start-up learning. Three objects of interest implantation methods are disclosed: texture mapping of defects, parametric synthesis of negative samples, and manual image editing.


Find Patent Forward Citations

Kim, Donglok. (2006). Accelerated learning in machine vision using artificially implanted defects (U.S. Patent No. 7096207). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7096207

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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