The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2006

Filed:

Aug. 04, 2003
Applicants:

Daniel Christian Shavers, Canton, OH (US);

Douglas Ashley Swift, Hudson, OH (US);

George Timothy Watts, North Canton, OH (US);

Robert Dean Irwin, Uniontown, OH (US);

Gary Wayne Corder, Akron, OH (US);

Ronald Thomas Dillard, Akron, OH (US);

Arthur Warner Moll, Akron, OH (US);

Robert Thomas Irwin, North Canton, OH (US);

Leonard Raymond Holm, Hartville, OH (US);

Nguyen Bau, Akron, OH (US);

Inventors:

Daniel Christian Shavers, Canton, OH (US);

Douglas Ashley Swift, Hudson, OH (US);

George Timothy Watts, North Canton, OH (US);

Robert Dean Irwin, Uniontown, OH (US);

Gary Wayne Corder, Akron, OH (US);

Ronald Thomas Dillard, Akron, OH (US);

Arthur Warner Moll, Akron, OH (US);

Robert Thomas Irwin, North Canton, OH (US);

Leonard Raymond Holm, Hartville, OH (US);

Nguyen Bau, Akron, OH (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/08 (2006.01); B29D 30/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatusfor correcting tire nonuniformity is disclosed. The invention is particularly suited for correcting tread runout and connicity problems for large off-road tires. Multiple measurements are taken in multiple circumferentially spaced planes which enable data to be fed into a computer which predicts an optimal profile to correct tire non-uniformities using preset rules. A virtual template directs correction of the tire profile.


Find Patent Forward Citations

Loading…