The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2006

Filed:

May. 30, 2002
Applicants:

Oren Yulevitch, Omer, IL;

Jacques Seror, Jerusalem, IL;

Yossi Fisher, Jerusalem, IL;

Joseph Peretz, Otniel, IL;

Jehuda Hartman, Rehovot, IL;

Inventors:

Oren Yulevitch, Omer, IL;

Jacques Seror, Jerusalem, IL;

Yossi Fisher, Jerusalem, IL;

Joseph Peretz, Otniel, IL;

Jehuda Hartman, Rehovot, IL;

Assignee:

Insyst Ltd., Jerusalem, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 11/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for providing early fault detection and alert generation in a multi-parameter process is provided. The method comprises defining a multi-dimensional space, each dimension representing a parameter of the process; applying an analysis of the process to the space in order to define regions of high and low probability of occurrence; measuring and mapping parameter values onto the space; and generating an alert whenever a parameter value is mapped into a region of low probability. The method and apparatus are also useful for identifying the cause of faults, adjusting the process to avoid faults and predicting a process-specific maintenance schedule.


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