The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2006
Filed:
Jul. 03, 2002
Reza Safaee-rad, Etobicoke, CA;
Aleksander Crnatovic, Toronto, CA;
Jeffrey A. Hawthorne, San Francisco, CA (US);
Ray Leerentveld, Palgrave, CA;
William K. Pratt, Los Altos, CA (US);
Sunil S. Sawkar, Fremont, CA (US);
Reza Safaee-Rad, Etobicoke, CA;
Aleksander Crnatovic, Toronto, CA;
Jeffrey A. Hawthorne, San Francisco, CA (US);
Ray Leerentveld, Palgrave, CA;
William K. Pratt, Los Altos, CA (US);
Sunil S. Sawkar, Fremont, CA (US);
Photon Dynamics, Inc., San Jose, CA (US);
Abstract
A method for inspecting a display panel includes capturing images of a portion of a plurality of display panels having display elements with an image acquisition device having sensor elements, each image comprising an image of approximately a first number of display elements captured with approximately a second number of sensor elements, the first number different from the second number, each image including a Moiré artifact pattern, combining the images of the portion of the plurality of display panels to form a reference image including a Moiré artifact pattern reference, capturing a sample image of a portion of a sample display panel having display elements with the image acquisition device, the sample image comprising an image of approximately the first number of display elements on the sample display captured with approximately the second number of sensor elements, the sample image including a sample Moiré artifact pattern, combining the sample image with the reference image to inhibit the sample Moiré artifact pattern from the sample image, and to form a test image, determining defects in display elements in the portion of the sample display panel by inspecting the test image, and determining whether to reject the sample display panel in response to the defects in the display elements.