The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2006

Filed:

Apr. 05, 2002
Applicants:

Takeshi Nakajima, Nara, JP;

Harumitsu Miyashita, Mino, JP;

Toshiya Akagi, Neyagawa, JP;

Shinichi Konishi, Nara, JP;

Inventors:

Takeshi Nakajima, Nara, JP;

Harumitsu Miyashita, Mino, JP;

Toshiya Akagi, Neyagawa, JP;

Shinichi Konishi, Nara, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01);
U.S. Cl.
CPC ...
Abstract

A recording/producing device for writing data on a recording medium, or reading data from the recording medium, wherein data matching a recording pattern so specified as to include a plurality of mutually different sets of mark lengths and space lengths is written on the recording medium, and the data is then read to generate data signals. An edge shift detector uses data signals to measure the edge shift amount of a mark formed on a recording medium for each set of a mark length and a space length. A record controller sets a recording parameter for each set of a mark length and a space length based on the measured edge shift amount.


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